Application of the annealing method in the task of diagnosing electrical defects in analog circuits of radioelectronic devices

Improving the methods of troubleshooting electronic devices remains an urgent and timely task at the current stage of development of this class of technical means. An electrical circuit that implements the functionality of an electronic device often contains elements whose parameters differ from the nominal values due to the peculiarities of the technological process of their production. This, in turn, may lead to a change in the output characteristics of the device, a malfunction or failure of an electronic device. The article presents the results of a study on the diagnosis of electrical defects in analog circuits of radioelectronic devices based on a modified algorithm for simulated annealing. The difficulties of applying the classical scheme of the algorithm and the impossibility of unambiguous identification of defects in electrical and radio elements are analyzed. A modified algorithm scheme is proposed that allows solving the optimization problem of finding the global extremum of the objective function for the problem of diagnosing the electronic component base. It is shown that for the algorithm to work effectively, it is necessary to correctly adjust its parameters and explore all possible options for generating neighboring solutions and temperature reduction mechanisms in order to choose the best implementation option. The annealing simulation algorithm has a number of advantages over other optimization algorithms. The operating time of the simulated annealing algorithm can be controlled using a cooling schedule. At the same time, an abrupt shutdown of the algorithm is allowed due to a change in the final temperature parameter. There is always a solution, no matter how much time has passed in the search process. This flexibility explains the widespread popularity of the annealing simulation algorithm in various fields of scientific research and applied problem solving.

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