A modified algorithm for simulated annealing for the task of diagnosing failures of analog electronic devices

The article presents the results of a study that developed a new method for automated diagnostics of functional components of electronic devices in order to identify parametric component failures, electrical failures, and short circuit detection. The relevance of the study is due to the ever-increasing complexity of modern electronics, when traditional diagnostic methods do not provide the necessary accuracy and efficiency of diagnostic procedures, which leads to an increase in equipment failures during operation and an increase in the cost of its maintenance and repair. The proposed method is based on a well-known algorithm for simulated annealing, which has been adapted to solve the problems of troubleshooting electronic devices. Objective: to propose a new method for diagnosing failures of electronic equipment based on a modified algorithm for simulated annealing, aimed at increasing the reliability of identification of faults occurring in nodes and modules during the operation of modern electronics, as well as to increase the degree of automation of diagnostic procedures. Physical and model experiments conducted during the study showed that the proposed method based on a modified algorithm effectively detects a number of failures, including complex cases of sequential failures that could not be identified using traditional methods. In addition, the proposed approach requires less time for analysis and makes it possible to increase the reliability of diagnostics of the studied nodes and modules of electronic equipment. The results obtained confirm the promising application of the method in the tasks of technical diagnostics, including its further integration into automated control systems of electronic equipment.

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