The problem of multiple faults in the memory chips of on-board equipment of spacecraft as a result of the impact of individual nuclear particles in outer space is considered. A review of the literature showed that the danger of multiple failures is real and will increase as technological standards for the design of electronic components decrease. Double multiple faults are currently the most pressing threat, as they are caused by charged particles with relatively low energies. Double faults can be adjacent or non-adjacent. Adjacent double faults are caused by the simultaneous action of a single nuclear particle. Non-adjacent faults are the result of the accumulation of single failures that occurred at different times in different storage cells of the same memory word. Under certain conditions, the occurrence of double non-contiguous errors can be avoided. To protect against double adjacent errors, correcting codes are used. These codes are relatively new and there is no general description of their construction. These codes are guaranteed to correct single errors and double adjacent errors, but have a significant probability of erroneously correcting a non-adjacent double error. But when moving to practical use, it is necessary to determine the requirements for the type of check matrix for these codes, to find a general algorithm for their construction for different memory word lengths, with low redundancy and high performance, provided that the correcting abilities of the code are subject to the requirements of detecting and correcting only single and double adjacent errors and no additional ones.
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